Search results

Search for "micro Hall magnetometry" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Focused electron beam induced deposition: A perspective

  • Michael Huth,
  • Fabrizio Porrati,
  • Christian Schwalb,
  • Marcel Winhold,
  • Roland Sachser,
  • Maja Dukic,
  • Jonathan Adams and
  • Georg Fantner

Beilstein J. Nanotechnol. 2012, 3, 597–619, doi:10.3762/bjnano.3.70

Graphical Abstract
  • the field of focused electron beam induced deposition. Keywords: atomic force microscopy; binary systems; electron beam induced deposition; granular metals; micro Hall magnetometry; radiation-induced nanostructures; strain sensing; Review Introduction Focused electron beam induced deposition (FEBID
PDF
Album
Video
Review
Published 29 Aug 2012
Other Beilstein-Institut Open Science Activities